Thin versus thick matching in the mantel-haenszel procedure for detecting DIF*

By: Donoghue, John RContributor(s): Allen, Nancy LMaterial type: TextTextDescription: 131-154Subject(s): MARCADORES | MODELOS MATEMATICOS | PREJUICIAR LA INFORMACION | PRUEBAS LARGAS
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Noviembre 1993
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Noviembre 1993

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